A multi-crystal wavelength dispersive hard x-ray spectrometer with high-energy 
resolution and large solid angle collection is described. The instrument is 
specifically designed for time-resolved applications of x-ray emission 
spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron 
Lasers (XFEL) and synchrotron radiation facilities. It also simplifies resonant 
inelastic x-ray scattering (RIXS) studies of the whole 2d RIXS plane. The 
spectrometer is based on the Von Hamos geometry. This dispersive setup enables 
an XES or XRS spectrum to be measured in a single-shot mode, overcoming the 
scanning needs of the Rowland circle spectrometers. In conjunction with the XFEL 
temporal profile and high-flux, it is a powerful tool for studying the dynamics 
of time-dependent systems. Photo-induced processes and fast catalytic reaction 
kinetics, ranging from femtoseconds to milliseconds, will be resolvable in a 
wide array of systems circumventing radiation damage.